Spletni seminar „Dnevi osciloskopov 2025“ 2. in 3. aprila 2025

Opening keynote

Without electronics, there is no power electronics. Therefore, it is essential to understand the interrelationship between semiconductor technologies to optimize performance of an electric power processing system and ensure product compliance.

This keynote will firmly demonstrate how advancements in both novel microelectronics and power semiconductor devices are closely intertwined. Furthermore, the significant implications for system-level integration will be emphasized and a clear pathway for overcoming the challenges that arise will be presented.

Part 1: How to choose the best oscilloscope and probing for my testing needs?

In this session, we will cover the fundamentals of oscilloscopes. What are the key elements of an oscilloscope, how much bandwidth and sampling rate do you need? We will also have a look at the possibilities of the digital trigger system, acquisition rate, FFT capabilities and much more. Probes are a fundamental part of oscilloscope measurements. Adding a probe to your system affects your signal and how you read it. Understanding the different types of probes and how to connect them to your DUT is key. Stay tune to know how to get the maximum out of your fundamental scope.

Part 2:

• Session a: How to overcome testing challenges in WBG applications?With the trend in power electronics to use new materials like SiC or GaN new test challenges like higher current and voltage slew rates as well as isolated gate drives and wideband current measurements occur. But how to overcome these and choose the right measurement equipment? This presentation will discuss current and new approaches to isolate your measurement equipment and in addition will give you a deeper view how to know how much isolation of the measurement equipment is really needed? Also how beneficial is the usage of an optical isolated probe for high-side measurements as well as current shunt measurements.

• Session b: AC losses – where do they come from?The DC resistance losses are well known and easy to determine. However, there are also AC losses in the power inductance, which are no longer so easy to determine. Both can be calculated very easily with Redexpert for different topologies at the working point of a SMPS. In this seminar, we will take a closer look at the causes and explain where these losses come from. Particularly with metal alloy inductors, there are very special physical effects that you should be aware of. This is also demonstrated by the live measurement at the end.

Robert Schillinger
from Würth Elektronik

Part 3:

• Session a: Power inductor saturation effect; The good, the bad and the ugly.A deeper dive into power inductors’ saturation with the aim of optimizing performance. We plan to demonstrate this practically using the multitude of functions provided by MXO Oscilloscope.

• Session b: From device characterization to system verificationAchieving robust designs in short development cycles is the goal in many domains. Especially in power electronics where strong market growth took place during past years, the need is even stronger to create reliable designs with less engineering margin. Gaining design speed can be achieved by model-based engineering. The verification of simulated results and the built hardware is not an easy undertaking with lots of uncertainties. The presentation gives an overview on how double pulse testing can be used over the entire design cycle of power stages to support the model-based approach and gain faster trustworthy results in a shorter period.

Ian Jannasch
from PE-Systems

Part 4:

• Session a: Signal Integrity Analysis on NRZ and PAM SignalsThis presentation focuses on signal integrity in high-speed digital systems, covering essential concepts and analysis techniques. We will learn about generating accurate eye diagrams, the significance of Pulse Amplitude Modulation (PAM) in high-speed communication, and advanced test solutions for PAM analysis. Additionally, we explore the concepts of equalization and embedding for optimizing signal fidelity. Discover the importance of these techniques and gain practical insights through live demonstrations. Join us to deepen your understanding of signal integrity and enhance system performance.

• Session b: EMI debugging and pre-compliance measurements made easy and cost effectiveEMI debugging and pre-compliance measurements can be a complex and costly process, but it doesn’t have to be. This presentation will show you how to simplify and streamline your EMI debugging and pre-compliance workflow, reducing costs and improving efficiency. We’ll explore typical tools and techniques for identifying and resolving EMI issues, and demonstrate how to use Rohde & Schwarz’s solutions to make EMI debugging and pre-compliance measurements easy and cost-effective. Join us to learn how to overcome common EMI challenges and ensure compliance with regulatory standards, all while saving time and resources.

Pasi Suhonen
from Rohde & Schwarz