Flying Probe testers and In-circuit tester highly advanced and scalable solutions. The Flying Scorpion FLS980Dxi »The Ultimate Probing Machine« is a full function Double Sided System configurable with up-to 22 closed loop Flying Probes with ±0.1 micron resolution and programmable probe angle of +6º to -6º degrees. It have extensive electrical test capabilities including analog (up-to GHz range). It allows for digital, mixed signal and Boundary Scan tests as well as advanced optical and thermal inspection facilitating also reverse engineering. Support for boards up-to 1050 x 640 mm.
4.0 Board & System Tester
Board DFT (Design for Testability) & Test Coverage Analyser. Test coverage Estimation. Test coverage Measurement.
Quality & Electronic Assembly Repair Management System.
ATS for Battery, High capacitance Capacitors, Solar cells, Inverters, Battery chargers, LED and LED power supplies, Transformers.
AOI predictive solution based on artificial antelligence (AI). Patented optical head with high resolution and high precision. Extremely reduced programming time. Modern SW, based on modularity.
www.delvi.tech Company Presentation 3D Aton AOI 3D Horus AOI
ATE systems for testing, troubleshooting and repair of PCBs, intended for the defense, transport and in general support and maintenance of electronic equipment for mission critical applications.
Obsolescence management of electronic cards and duplication of obsolete electronic boards, where it is necessary to extend the lifetime of the equipments in operation.
Test systems for quality assurance in electronics production New methods to make testable what seems untestable. Innovative Flying Probers, very latest generation in-circuit testers.
Tools for in-system programming of Flash and programmable logics; board and systems tests (std IEEE-1149.1 and laterst) with integration with all major ATE manufactures; system debug, PCB prototype verification, production and annual maintenance. “At speed test” via FPGA μP.
AOI ATE solutions for SMT, DIP, LED, Touch Panel. First Article Inspection (FAI) AOI plus automatic probing RC measurements up to 01005 (Imperial).
Protocol Decode, and PHY layer testing solutions on T&M equipment. Implementation of Innovative & comprehensive protocol decodes as well as PHY layer testing solutions that span the serial data, telecom, automotive, and defense electronics segments.
Fastest ICT functional platforms provide electronics manufacturers with reliable high-quality and high-volume testing for the latest printed circuit board assembly (PCBA) technologies used in automotive, industrial, computing, consumer, communications, and defense end-products. The structural and functional test cover manufacturing, component, process, and performance defects for high-performance analog, digital, and mixed-signal devices. The best for High-Reliability and/or High-Complexity products.
TestStation Duo, Multi-Site, High Pin Count (up to 15,360 pins), Inline or Offline.